TA-CON-2017-026

Single-Event Upsets (SEUs) in the configuration memory of a 28-nm FPGA, used in the PANDA electromagnetic calorimeter, have been studied. Results from neutron and proton irradiations are presented. A GEANT4-based Monte Carlo simulation of SEU mechanisms in nanometric silicon volumes has been developed for studies of the energy dependence. At PANDA, a neutron flux of 1*10^2 cm^−2 s^−1 at the location of the front-end modules is expected at the lowest antiproton beam momentum and a luminosity of 1*10^31 cm^−2 s^−1, leading to a predicted Mean Time Between Failures of 47(10) hours per FPGA in the calorimeter.